Features
- High sensitivity from 950 nm to 1700 nm
- Resolution: 640 × 512 pixels
- Low noise and high stability with cooling
- Simultaneous output from two interfaces: analog (EIA) port and USB 3.0 port
- Frame rate of 60 frames /s
Applications
- Internal inspections of silicon wafers and devices
- Evaluation of solar cells
- Evaluation and analysis of optical communication devices
- EL/PL image acquisition
Specifications
|
Type number |
C12741-03 |
|---|---|
| Imaging device | InGaAs sensor |
| Effective no. of pixels | 640 (H)×512 (V) |
| Cell size | 20 μm × 20 μm |
| Effective area | 12.8 mm (H) × 10.24 mm (V) |
| Readout speed | 59.774 frames/s |
| Exposure time | 16.7 ms to 1 s (Internal mode) *1 |
| Cooling method | Peltier cooling |
| Cooling temperature | +10 °C (Forced-air cooled, Ambient temperature +25 °C) |
| External trigger mode | Edge trigger, level trigger, start trigger |
| External trigger signal routing | SMA |
| Trigger delay function | 0 to 1 s (in 10 μs steps) |
| Image processing functions | background subtraction, Shading correction |
| Interface | EIA, USB 3.0 |
| Connector | USB 3.0 micro B type |
| A/D converter | 14 bit |
| Lens mount | C-mount |
| Power supply | DC +12 V |
| Power consumption | Approx. 16 W |
| Ambient operating temperature | 0 ℃ to +40 ℃ * |
| Ambient storage temperature | -10 ℃ to +50 ℃ |
| Ambient operating humidity | 30 % to 80 % (with no condensation) |
| Ambient storage humidity | 90 % max. (with no condensation) |
Spectral response

Dimensions

| 型號 | 概述 | 詢價數量 |
|---|