SWIR (short wavelength infrared) imaging is a great solution for non-destructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality.

Example applications include checking liquid volumes in packages, inspecting contents of sealed containers, and detecting damages and contaminants in agricultural products. In addition, applications in the semiconductor industry include Si wafer pattern inspection and solar cell defect detection.Integrating SWIR imaging into production lines requires cameras such as the C15333-10E04 InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection.

Compare to the conventional model, the C15333-10E04 has improved usability by adding an edge trigger function, which can shoot with a certain exposure time even the conveyor belt speed is changed while shooting. It also becomes compatible with a trigger enable function, which shoots only when an object is passing in front of the camera.