BEAMWAVE
The BeamWave sensors deliver intensity and wavefront measurements simultaneously in an all-in-one device. Instead of using microlens array for wavefront sampling, these sensors are based on Digital Wavefront Technology ®, hence the number of wavefront measurement points is only limited by camera resolution providing a high spatial resolution wavefront,
These sensors are typically used for either simultaneous laser beam profiling and beam propagation analysis or high resolution wavefront measurement for optical elements characterization.
BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF.
Sucessfully used for applications such as:
Real Time Laser Beam Monitoring
Instant Laser Beam Diagnostic
Laser Diodes, fiber Lasers, semiconductors Lasers
Solid state lasers, lasers Telecom assemblies
Optics characterization : microlenses and ophthalmic lenses
SIMULTANEOUS INTENSITY AND WAVEFRONT ANALYSIS
High resolution intensity and wavefront provided by Digital Wavefront Technology®
HIGH RESOLUTION WAVEFRONT MEASUREMENT
Spatial wavefront mapping only limited by camera resolution, no microlens array sampling
ALL IN ONE DEVICE FOR BEAM MONITORING
Beam profiling including intensity distribution and beam propagation parameters in a single device
Specification
|
Wavelength range, nm |
BeamWave-500 -1000 -1500 : 350-1100 BeamWave-FIR : 2000-16000 |
|
Maximum Input Beam Diameter, mm |
BeamWave-500 : 4.8 BeamWave-1000 -1500 : 6.4 BeamWave-FIR: 8 |
|
Pixels |
BeamWave-500 -1000 -1500 : 1392 x 1040 BeamWave-FIR: 640 x 480 |
|
Wavefront Measurement Points / lateral resolution |
BeamWave-500 : 500 x 500, / 6.45µm BeamWave-1000 -1500 : 1000 x 1000 / 6.45µm BeamWave-FIR : 640 x 480 / 17µm |
|
Wavefront sensitivity @ λ = 633 nm |
BeamWave-500 : λ/200 BeamWave-1000 : λ/200 BeamWave-1500 : Flexible |
Software
Supplied with GetLase ® and GetWave ® GUI software includes comprehensive measuring tools for beam profiling and wavefront analysis:
Intensity & wavefront acquisition
Live display 2D and 3D intensity, wavefront, PSF
Zernike Analysis, low and high order aberrations, astigmatism, etc.
Intensity distribution, XY profile, centroid, divergence angle etc.
Beam propagation analysis
Data export & report
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