Features
- High sensitivity from 950 nm to 1700 nm
- Resolution: 640 × 512 pixels
- Low noise and high stability with cooling
- Simultaneous output from two interfaces: analog (EIA) port and USB 3.0 port
- Frame rate of 60 frames /s
Applications
- Internal inspections of silicon wafers and devices
- Evaluation of solar cells
- Evaluation and analysis of optical communication devices
- EL/PL image acquisition
Specifications
Type number |
C12741-03 |
---|---|
Imaging device | InGaAs sensor |
Effective no. of pixels | 640 (H)×512 (V) |
Cell size | 20 μm × 20 μm |
Effective area | 12.8 mm (H) × 10.24 mm (V) |
Readout speed | 59.774 frames/s |
Exposure time | 16.7 ms to 1 s (Internal mode) *1 |
Cooling method | Peltier cooling |
Cooling temperature | +10 °C (Forced-air cooled, Ambient temperature +25 °C) |
External trigger mode | Edge trigger, level trigger, start trigger |
External trigger signal routing | SMA |
Trigger delay function | 0 to 1 s (in 10 μs steps) |
Image processing functions | background subtraction, Shading correction |
Interface | EIA, USB 3.0 |
Connector | USB 3.0 micro B type |
A/D converter | 14 bit |
Lens mount | C-mount |
Power supply | DC +12 V |
Power consumption | Approx. 16 W |
Ambient operating temperature | 0 ℃ to +40 ℃ * |
Ambient storage temperature | -10 ℃ to +50 ℃ |
Ambient operating humidity | 30 % to 80 % (with no condensation) |
Ambient storage humidity | 90 % max. (with no condensation) |
Spectral response
Dimensions
型號 | 概述 | 詢價數量 |
---|