ORCA-Flash4.0 LT3

採用sCMOS傳感器的第二代CMOS攝像頭,專為科研使用而設計。 ORCA-Flash4.0 LT3 旨在成為新的主力數碼相機,為每個成像項目帶來高端性能。 

Effective no. of pixels
2048 (H)×2048 (V)
Readout speed
30 frames/s
Readout noise
0.9 electrons
Dynamic range
33 000:1


  • Low readout noise (Standard scan): 1.5 electrons rms, 0.9 electrons median
  • High speed readout (Rapid rolling, Full resolution): 40 frames/s
  • Large field of view: 13.312 mm (H)×13.312 mm (V)
  • High resolution: 2048 (H)×2048 (V)
  • High quantum efficiency: 82 % (Peak QE)



  • Time-lapse imaging
  • Multidimensional imaging
  • Ca2+ imaging
  • DNA chip reading


High S/N equivalent or better than BSI camera

The graph below compares the readout noise distribution with the Gen II BSI camera* and shows that the ORCA-Flash4.0 LT3 has more pixels with smaller readout noise.

With a low readout noise of 1.5 electrons rms, the ORCA-Flash4.0 LT3 delivers high S/N comparable to or better than a BSI camera, especially in the low light range.

This performance can be demonstrated in high quality multidimensional imaging, as typified by long time-lapse imaging with low excitation light with low phototoxicity and photobleaching.


* BSI camera: Back-side illuminated camera


High speed readout

The ORCA-Flash4.0 LT3 is capable of 40 frames/second readout, which is even faster than the conventional ORCA-Flash4.0 LT+ (30 frames/second). This is useful for applications which requires real time measurement with high temporal resolution.


Large field of view

The wide field of view of 13.312 mm (H) × 13.312 mm (V) allows more information to be obtained in a single shot. 

This contributes to higher throughput in experiments such as DNA chip reading.



Product number C11440-42U40
Imaging device Scientific CMOS image sensor
Effective number of pixels 2048 (H) × 2048 (V)
Pixel size 6.5 μm (H) × 6.5 μm (V)
Effective area 13.312 mm (H) × 13.312 mm (V)
Full well capacity (typ.) 30 000 electrons
Dynamic range (typ.) 33 000: 1 *1 20 000: 1 *2
Cooling method Forced-air cooled, peltier cooling
Cooling temperature

Forced-air cooled

(FAN speed: Fast ambient temperature: +10 °C to +30 °C)

+10 °C
Frame rate at full resolution Rapid rolling 40 frames/s
Standard scan 30 frames/s
Readout noise (typ.) Rapid rolling 1.9 electrons rms / 1.3 electrons median
Standard scan 1.5 electrons rms / 0.9 electrons median
Dark current (typ.) Cooling temperature: +10 °C 0.6 electrons/pixel/s
Digital output 16 bit
Exposure time Internal trigger mode *3 Rapid rolling 1 ms to 10 s
Standard scan 3 ms to 10 s

Internal trigger mode

with sub-array readout

Rapid rolling 40 μs to 10 s
Standard scan 129.99 μs to 10 s
External trigger input mode

Edge trigger, Global reset edge trigger,  Level trigger, Global reset level trigger,  Synchronous readout trigger, Start trigger

Trigger delay function 0 s to 10 s in 1 μs steps
Trigger input connector SMA
Trigger output

3 programmable timing outputs,  Trigger ready output, Global exposure timing output, Low output, High output

Trigger output connector SMA
Binning 2×2, 4×4
Sub-array Yes
Interface USB 3.1 Gen 1
Lens mount C-mount
Power supply AC 100 V to AC 240 V, 50 Hz / 60 Hz
Power consumption Approx. 75 VA
Ambient operating temperature FAN speed: Fast 0 °C to +40 °C
Ambient operating humidity 30 % to 80 % (With no condensation)
Ambient storage temperature −10 °C to +50 °C
Ambient storage humidity 90 % Max. (With no condensation)


*1  Calculated from the ratio of the full well capacity and the readout noise (median) in standard scan

*2  Calculated from the ratio of the full well capacity and the readout noise (rms) in standard scan

*3  Minimum exposure time in internal trigger mode varies depending on sub-array size and position.


Spectral response


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